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Die Surface Contamination
Figure 1. Die
Surface Contamination
Figure
1 shows SEM photos of a microscopic heap of contaminant material on the
surface of a die at low magnification (left) and high magnification
(right).
EDX analysis
needs to be performed on dice such as this to identify the elements
present in the contamination. The presence of foreign elements such as Cl,
S, and P can lead to corrosion, and must therefore be considered as a
possible ground for rejecting all units that may be affected by the same
contamination issue.
See Also:
Internal Contamination;
Die Corrosion
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