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        EESemi.com Forum Archives 
		
        
        Reliability Assessment for a
        Cratering Issue 
                       
        
        
        
        
        
                
        
        
              
		   
         
        
        
        
        
        
        
        
        
        
        
        
        The term 'cratering' 
		refers to silicon damage under the bond pad caused by excessive
		wirebonding. Subtle cases would show 
		microcracks in the silicon under the bond pad, but extreme cases would 
		result in chunks of silicon being displaced, hence the name 'cratering'.  
		Cratering is a serious reliability issue because they can go undetected 
		during production, leading to field failures later on.  The 
		archived forum thread below discusses appropriate
		reliability tests that can be done on 
		samples from lots being suspected of having latent or incipient 
		cratering damage. 
		
           
          
		 
        
		
			
				
				
					
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						Posted by Rivs: Wed 
						Dec 12, 2007 10:32 am    Post 
						subject: Cratering Issue  | 
					 
					
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						guys I need you help on what 
						reliability test to perform on cratering affected units, 
						thanks  | 
					 
				 
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						Posted by FARel Engr: 
						Thu Dec 13, 2007 11:17 pm   
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						As a minimum you should do 
						preconditioned TCT on an adequate number of samples. 
						Aside from the usual readpoints, you must perform a 
						thorough inspection of the Si under the bond pads after 
						the precon, and after the TCT. Thus, you need to have 
						enough samples to account for sample 'losses' after each 
						'crater check' since this procedure is destructive.  | 
					 
				 
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						Posted by Paula: Fri 
						Dec 14, 2007 5:23 pm    Post 
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						Sa tingin ko wala appropriate rel 
						test for bondpad cratering. Usually, scrap na yung 
						affected lot.  
						 
						Try mo mag-crater test sa mga good units, medyo malaking 
						sample size, pag meron cratering ibig sabihin- test 
						can't weed out units with cratering. I don't see a 
						reason bakit kailangan pa ng rel test.  
						 
						My thoughts.  | 
					 
				 
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						Posted by Rivs: Sat 
						Dec 15, 2007 7:58 am    Post 
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						thanks guys.  
						 
						yes paula even good units have cratering. reliability 
						test purpose is to check if the device (good affected 
						with cratering) will still pass.  
						 
						Rejected parts failed leakage parameters werein 
						cratering is not the main suspect, as experienced device 
						affected with cratering fails breakdown voltage 
						(shorted).  
						 
						Also rejected parts have undergone microthermography 
						(liquid crystal technique) and hotspot was seen on the 
						gate runners while none seen on the good units but after 
						crater test we found out that cratering is evident on 
						both good and rejected parts.  
						 
						Anyway thanks for the help guys I highly appreciated the 
						responses [/b]  | 
					 
				 
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						Posted by FARel Engr: 
						Thu Dec 20, 2007 3:55 am   
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						The rel tests that I earlier 
						recommended is to confirm if other lots are affected by 
						the same cratering issue (containment of affected lots) 
						- not to determine if affected lots will survive in the 
						field. I agree with Paula on the point that lots already 
						known to be affected by cratering need to be scrapped.
						 
						 
						However, lots suspected to be affected, but not yet 
						confirmed to be affected, will benefit from rel testing, 
						since it would also not be wise to just scrap lots on 
						the mere suspicion of being affected, unless the process 
						that caused the cratering has been identified and the 
						suspected lots underwent the same process.  | 
					 
				 
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						Posted by Rivs: Thu 
						Dec 20, 2007 8:11 am    Post 
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						However, lots suspected to be affected, but not yet 
						confirmed to be affected, will benefit from rel testing, 
						since it would also not be wise to just scrap lots on 
						the mere suspicion of being affected, unless the process 
						that caused the cratering has been identified and the 
						suspected lots underwent the same process.  
						 
						Hi farel engr,  
						 
						thank you very much for the response.  | 
					 
				 
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