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        EESemi.com Forum Archives 
		
        
        Computation of
        Electrical Shift/Drift After Rel Test 
                       
        
        
        
        
        
                
        
        
              
		         
         
        
        
        
        
        
        
        
        
        
        
        
        Large changes 
		in the read-outs of some electrical parameters of rel samples after they 
		have been subjected to reliability testing may 
		be an indication of a device problem that can result in field failures 
		later on.  As such, the % shift or % drift of these electrical 
		parameters need to be understood, especially if they result in 
		electrical test failures after the reliability 
		tests. This is the topic of the archived forum thread below.  
		
          
		 
        
		
			
				
				
					
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						Posted by Rivs: Wed 
						Jan 16, 2008 1:42 pm    Post 
						subject: Electrical %shift / drift computation  | 
					 
					
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						guys need again your expertise 
						I'm doing a electrical %shift / drift on our devices 
						after reliability test and using the formula of 
						(pre-test data - post-test data / pre-test data * 100) 
						are you using the same formula as I am ? please help, is 
						there any standards used for this?  | 
					 
				 
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						Posted by FARel Engr: 
						Thu Jan 17, 2008 3:39 am   
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						Hi Rivs, what kind of device are 
						we talking about and which particular parameter of this 
						device is being measured for the shift/drift?  | 
					 
				 
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						Posted by Rivs: Thu 
						Jan 17, 2008 8:04 am    Post 
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						FARel thanks for the immediate response, I am talking 
						about discrete devices such as FETs, Thyristors, 
						Rectifiers etc . . . Actually all the electrical test 
						parameters are being measured like breakdown voltages, 
						leakage current, forward voltage, etc . . .  | 
					 
				 
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						Posted by Paula: Thu 
						Jan 17, 2008 9:27 am    Post 
						subject: Re: Electrical %shift / drift computation  | 
					 
					
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						I can't recall but I think, logically, it should be 
						(post-pre)/pre * 100. An increase will give you a + 
						drift while a decrease - drift.  
						 
						Back when I worked for discrete, we do drift analysis 
						for all reliability tests. The good thing is our tester 
						are capable of datalogging parameters, then we have a 
						DOS (batch) program where we run this datalog and in a 
						minutes you can get drift data of different parameters 
						from a given reliability sample size simultaneously.  | 
					 
				 
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						Posted by Rivs: Thu 
						Jan 17, 2008 9:56 am    Post 
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						Paull thanks this is what I used 
						before. I just want to have a copy of any standards that 
						says so. Do you have or know one?  | 
					 
				 
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						Posted by Paula: Thu 
						Jan 17, 2008 1:24 pm    Post 
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						Try JESD86.   | 
					 
				 
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						Posted by Rivs: Thu 
						Jan 17, 2008 1:41 pm    Post 
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						Paula sorry for the typo error I'm in a hurry this 
						morning, Thanks for the info I'll try to look at this  | 
					 
				 
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