EESemi.com Forum Archives

Computation of Electrical Shift/Drift After Rel Test

                

Large changes in the read-outs of some electrical parameters of rel samples after they have been subjected to reliability testing may be an indication of a device problem that can result in field failures later on.  As such, the % shift or % drift of these electrical parameters need to be understood, especially if they result in electrical test failures after the reliability tests. This is the topic of the archived forum thread below.

  

Posted by Rivs: Wed Jan 16, 2008 1:42 pm    Post subject: Electrical %shift / drift computation

 

guys need again your expertise I'm doing a electrical %shift / drift on our devices after reliability test and using the formula of (pre-test data - post-test data / pre-test data * 100) are you using the same formula as I am ? please help, is there any standards used for this?

 

Posted by FARel Engr: Thu Jan 17, 2008 3:39 am    Post subject:

 

Hi Rivs, what kind of device are we talking about and which particular parameter of this device is being measured for the shift/drift?

 

Posted by Rivs: Thu Jan 17, 2008 8:04 am    Post subject:

 

FARel thanks for the immediate response, I am talking about discrete devices such as FETs, Thyristors, Rectifiers etc . . . Actually all the electrical test parameters are being measured like breakdown voltages, leakage current, forward voltage, etc . . .

 

Posted by Paula: Thu Jan 17, 2008 9:27 am    Post subject: Re: Electrical %shift / drift computation

 

I can't recall but I think, logically, it should be (post-pre)/pre * 100. An increase will give you a + drift while a decrease - drift.

Back when I worked for discrete, we do drift analysis for all reliability tests. The good thing is our tester are capable of datalogging parameters, then we have a DOS (batch) program where we run this datalog and in a minutes you can get drift data of different parameters from a given reliability sample size simultaneously.

 

Posted by Rivs: Thu Jan 17, 2008 9:56 am    Post subject:

 

Paull thanks this is what I used before. I just want to have a copy of any standards that says so. Do you have or know one?

 

Posted by Paula: Thu Jan 17, 2008 1:24 pm    Post subject:

 

Try JESD86.

 

Posted by Rivs: Thu Jan 17, 2008 1:41 pm    Post subject:

 

Paula sorry for the typo error I'm in a hurry this morning, Thanks for the info I'll try to look at this

      

Back to the 'Best of Forums' Archives

      

HOME

 

      

Copyright © 2008 EESemi.com. All Rights Reserved.